{"id":"1509264","title":"Automated test data generation for aspect-oriented programs","pdf":"https://dl.acm.org/ft_gateway.cfm?id=1509264&ftid=602720&dwn=1&CFID=19940691&CFTOKEN=8b324e98a5438d9f-3D396677-BCDE-0613-855CDABFF4BE8ED5","authors":[{"type":"author_page","name":"Mark Harman","id":"81100123313","affiliation":{"type":"inst_page","name":"King's College London, London, United Kingdom","id":"60011520"}},{"type":"author_page","name":"Fayezin Islam","id":"81414595946","affiliation":null},{"type":"author_page","name":"Tao Xie","id":"81314487030","affiliation":{"type":"inst_page","name":"North Carolina State University, Raleigh, NC, USA","id":"60004923"}},{"type":"author_page","name":"Stefan Wappler","id":"81100307475","affiliation":{"type":"inst_page","name":"Berner & Mattner Systemtechnik GmbH, Berlin, Germany","id":"60096445"}}],"publisher":{"text":"AOSD '09 Proceedings of the 8th ACM international conference on Aspect-oriented software development","details":"Pages 185-196\nCharlottesville, Virginia, USA — March 02 - 06, 2009\nACM New York, NY, USA  ©2009\ntable of contents\nISBN: 978-1-60558-442-3\ndoi>10.1145/1509239.1509264"}}