{"id":"2162067","title":"Comprehensively evaluating conformance error rates of applying aspect state machines","pdf":"https://dl.acm.org/ft_gateway.cfm?id=2162068&ftid=1167311&dwn=1&CFID=109511651&CFTOKEN=53aa662d04f2982-66B82081-A6D2-1FCD-63F1A773BEA60045","authors":[{"type":"author_page","name":"Shaukat Ali","id":"81337487434","affiliation":{"type":"inst_page","name":"Certus Software V&V Center, Simula Research Laboratory, Lysaker, Norway","id":"60000645"}},{"type":"author_page","name":"Tao Yue","id":"81413591747","affiliation":{"type":"inst_page","name":"Certus Software V&V Center, Simula Research Laboratory, Lysaker, Norway","id":"60000645"}},{"type":"author_page","name":"Zafar Iqbal Malik","id":"81337491454","affiliation":null}],"publisher":{"text":"AOSD '12 Proceedings of the 11th annual international conference on Aspect-oriented Software Development","details":"Pages 155-166\nPotsdam, Germany — March 25 - 30, 2012\nACM New York, NY, USA  ©2012\ntable of contents\nISBN: 978-1-4503-1092-5\ndoi>10.1145/2162049.2162068"}}